/********** Copyright 1990 Regents of the University of California. All rights reserved. Author: 1987 Gary W. Ng **********/ /* * NevalSrc (noise, lnNoise, ckt, type, node1, node2, param) * This routine evaluates the noise due to different physical * phenomena. This includes the "shot" noise associated with dc * currents in semiconductors and the "thermal" noise associated with * resistance. Although semiconductors also display "flicker" (1/f) * noise, the lack of a unified model requires us to handle it on a * "case by case" basis. What we CAN provide, though, is the noise * gain associated with the 1/f source. */ /* Modified by Alessio Cacciatori: S-Params noise is calculated as noise current correlation matrix. Per each noise source, the noise voltage at RF ports is converted as an input noise current source by using (already availalble) Y matrix. Outside RFSPICE declaration, code is legacy NGSPICE code. */ #include "ngspice/ngspice.h" #include "ngspice/cktdefs.h" #include "ngspice/const.h" #include "ngspice/noisedef.h" #ifdef RFSPICE extern CMat* eyem; extern CMat* zref; extern CMat* gn; extern CMat* gninv; extern CMat* vNoise; extern CMat* iNoise; #include "../../maths/dense/denseinlines.h" #endif void NevalSrc(double* noise, double* lnNoise, CKTcircuit* ckt, int type, int node1, int node2, double param) { #ifdef RFSPICE if (ckt->CKTcurrentAnalysis & DOING_SP) { double inoise = 0.0; switch (type) { case SHOTNOISE: inoise = 2 * CHARGE * fabs(param); /* param is the dc current in a semiconductor */ *noise = inoise; *lnNoise = log(MAX(*noise, N_MINLOG)); break; case THERMNOISE: inoise = 4 * CONSTboltz * ckt->CKTtemp * param; /* param is the conductance of a resistor */ *noise = inoise; *lnNoise = log(MAX(*noise, N_MINLOG)); break; case N_GAIN: inoise = 0.0; *noise = cmodu(csubco(ckt->CKTadjointRHS->d[0][node1], ckt->CKTadjointRHS->d[0][node2])); break; } inoise = sqrt(inoise); // Calculate input equivalent noise current source (we have port impedance attached) for (int s = 0; s < ckt->CKTportCount; s++) vNoise->d[0][s] = cmultdo(csubco(ckt->CKTadjointRHS->d[s][node1], ckt->CKTadjointRHS->d[s][node2]), inoise); for (int d = 0; d < ckt->CKTportCount; d++) { cplx in; double yport = 1.0 / zref->d[d][d].re; in.re = vNoise->d[0][d].re * yport; in.im = vNoise->d[0][d].im * yport; for (int s = 0; s < ckt->CKTportCount; s++) caddc(&in, in, cmultco(ckt->CKTYmat->d[d][s], vNoise->d[0][s])); iNoise->d[0][d] = in; } for (int d = 0; d < ckt->CKTportCount; d++) for (int s = 0; s < ckt->CKTportCount; s++) ckt->CKTNoiseCYmat->d[d][s] = caddco(ckt->CKTNoiseCYmat->d[d][s], cmultco(iNoise->d[0][d], conju(iNoise->d[0][s]))); return; } #endif double realVal; double imagVal; double gain; realVal = ckt->CKTrhs[node1] - ckt->CKTrhs[node2]; imagVal = ckt->CKTirhs[node1] - ckt->CKTirhs[node2]; gain = (realVal * realVal) + (imagVal * imagVal); switch (type) { case SHOTNOISE: *noise = gain * 2 * CHARGE * fabs(param); /* param is the dc current in a semiconductor */ *lnNoise = log(MAX(*noise, N_MINLOG)); break; case THERMNOISE: *noise = gain * 4 * CONSTboltz * ckt->CKTtemp * param; /* param is the conductance of a resistor */ *lnNoise = log(MAX(*noise, N_MINLOG)); break; case N_GAIN: *noise = gain; break; } } /* * NevalSrc2 (noise, lnNoise, ckt, type, node1, node2, param, node3, node4, param2) * This routine is a modified version of NevalSrc() that computes * the output noise due to two fully-correlated noise sources. It is * useful for implementing correlated gate and drain noises in MOSFETs. * * Like NevalSrc(), it evaluates the noise due to different physical * phenomena. This includes the "shot" noise associated with dc * currents in semiconductors and the "thermal" noise associated with * resistance. Although semiconductors also display "flicker" (1/f) * noise, the lack of a unified model requires us to handle it on a * "case by case" basis. What we CAN provide, though, is the noise * gain associated with the 1/f source. */ /* Modified by Darsen Lu for BSIM4 tnoiMod=2 10/10/2010 */ void NevalSrc2( double* noise, double* lnNoise, CKTcircuit* ckt, int type, int node1, int node2, double param1, int node3, int node4, double param2, double phi21) /* Phase of signal 2 relative to signal 1 */ { double realVal1, imagVal1; double realVal2, imagVal2; double realOut, imagOut, param_gain; double T0, T1, T2, T3; #ifdef RFSPICE if (ckt->CKTcurrentAnalysis & DOING_SP) { double knoise = 0.0; T0 = sqrt(param1); T1 = sqrt(param2); cplx cfact; cfact.re = cos(phi21); cfact.im = sin(phi21); switch (type) { case SHOTNOISE: knoise = 2 * CHARGE; /* param is the dc current in a semiconductor */ *noise = knoise; *lnNoise = log(MAX(*noise, N_MINLOG)); break; case THERMNOISE: knoise = 4 * CONSTboltz * ckt->CKTtemp; /* param is the conductance of a resistor */ // For this simulation we are not collecting any statistics on output nodes. Force noise to 0 *noise = knoise; *lnNoise = log(MAX(*noise, N_MINLOG)); break; case N_GAIN: knoise = 0.0; *noise = cmodu(csubco(ckt->CKTadjointRHS->d[0][node1], ckt->CKTadjointRHS->d[0][node2])); break; } knoise = sqrt(knoise); // Calculate input equivalent noise current source (we have port impedance attached) for (int s = 0; s < ckt->CKTportCount; s++) { cplx vNoiseA = cmultdo(csubco(ckt->CKTadjointRHS->d[s][node1], ckt->CKTadjointRHS->d[s][node2]), knoise * sqrt(param1)); cplx vNoiseB = cmultco(cmultdo(csubco(ckt->CKTadjointRHS->d[s][node3], ckt->CKTadjointRHS->d[s][node4]), knoise * sqrt(param1)), cfact); vNoise->d[0][s] = caddco(vNoiseA, vNoiseB); } for (int d = 0; d < ckt->CKTportCount; d++) { double yport = 1.0 / zref->d[d][d].re; cplx in; in.re = vNoise->d[0][d].re * yport; in.im = vNoise->d[0][d].im * yport; for (int s = 0; s < ckt->CKTportCount; s++) caddc(&in, in, cmultco(ckt->CKTYmat->d[d][s], vNoise->d[0][s])); iNoise->d[0][d] = in; } for (int d = 0; d < ckt->CKTportCount; d++) for (int s = 0; s < ckt->CKTportCount; s++) ckt->CKTNoiseCYmat->d[d][s] = caddco(ckt->CKTNoiseCYmat->d[d][s], cmultco(iNoise->d[0][d], conju(iNoise->d[0][s]))); return; } #endif realVal1 = ckt->CKTrhs[node1] - ckt->CKTrhs[node2]; imagVal1 = ckt->CKTirhs[node1] - ckt->CKTirhs[node2]; realVal2 = ckt->CKTrhs[node3] - ckt->CKTrhs[node4]; imagVal2 = ckt->CKTirhs[node3] - ckt->CKTirhs[node4]; T0 = sqrt(param1); T1 = sqrt(param2); T2 = T1 * cos(phi21); T3 = T1 * sin(phi21); realOut = T0 * realVal1 + T2 * realVal2 - T3 * imagVal2; imagOut = T0 * imagVal1 + T2 * imagVal2 + T3 * realVal2; param_gain = (realOut * realOut) + (imagOut * imagOut); switch (type) { case SHOTNOISE: *noise = 2.0 * CHARGE * fabs(param_gain); /* param is the dc current in a semiconductor */ *lnNoise = log(MAX(*noise, N_MINLOG)); break; case THERMNOISE: *noise = 4.0 * CONSTboltz * ckt->CKTtemp * param_gain; /* param is the conductance of a resistor */ *lnNoise = log(MAX(*noise, N_MINLOG)); break; case N_GAIN: *noise = 0.0; break; } } /* PN 2003: The following function includes instance dtemp in thermal noise calculation. It will replace NevalSrc as soon as all devices will implement dtemp feature. */ void NevalSrcInstanceTemp(double* noise, double* lnNoise, CKTcircuit* ckt, int type, int node1, int node2, double param, double param2) { #ifdef RFSPICE // For this simulation we are not collecting any statistics on output nodes. Force noise to 0 if (ckt->CKTcurrentAnalysis & DOING_SP) { double inoise = 0.0; switch (type) { case SHOTNOISE: inoise = 2 * CHARGE * fabs(param); /* param is the dc current in a semiconductor */ // For this simulation we are not collecting any statistics on output nodes. Force noise to 0 *noise = inoise; *lnNoise = log(MAX(*noise, N_MINLOG)); break; case THERMNOISE: inoise = 4.0 * CONSTboltz * (ckt->CKTtemp + param2) * param; /* param is the conductance of a resistor */ // For this simulation we are not collecting any statistics on output nodes. Force noise to 0 *noise = inoise; *lnNoise = log(MAX(*noise, N_MINLOG)); break; case N_GAIN: inoise = 0.0; *noise = cmodu(csubco(ckt->CKTadjointRHS->d[0][node1], ckt->CKTadjointRHS->d[0][node2])); return; } inoise = sqrt(inoise); // Calculate input equivalent noise current source (we have port impedance attached) for (int s = 0; s < ckt->CKTportCount; s++) vNoise->d[0][s] = cmultdo(csubco(ckt->CKTadjointRHS->d[s][node1], ckt->CKTadjointRHS->d[s][node2]), inoise); for (int d = 0; d < ckt->CKTportCount; d++) { cplx in; double yport = 1.0 / zref->d[d][d].re; in.re = vNoise->d[0][d].re * yport; in.im = vNoise->d[0][d].im * yport; for (int s = 0; s < ckt->CKTportCount; s++) caddc(&in, in, cmultco(ckt->CKTYmat->d[d][s], vNoise->d[0][s])); iNoise->d[0][d] = in; } for (int d = 0; d < ckt->CKTportCount; d++) for (int s = 0; s < ckt->CKTportCount; s++) ckt->CKTNoiseCYmat->d[d][s] = caddco(ckt->CKTNoiseCYmat->d[d][s], cmultco(iNoise->d[0][d], conju(iNoise->d[0][s]))); return; } #endif double realVal; double imagVal; double gain; realVal = ckt->CKTrhs[node1] - ckt->CKTrhs[node2]; imagVal = ckt->CKTirhs[node1] - ckt->CKTirhs[node2]; gain = (realVal * realVal) + (imagVal * imagVal); switch (type) { case SHOTNOISE: *noise = gain * 2 * CHARGE * fabs(param); /* param is the dc current in a semiconductor */ *lnNoise = log(MAX(*noise, N_MINLOG)); break; case THERMNOISE: *noise = gain * 4 * CONSTboltz * (ckt->CKTtemp + param2) /* param2 is the instance temperature difference */ * param; /* param is the conductance of a resistor */ *lnNoise = log(MAX(*noise, N_MINLOG)); break; case N_GAIN: *noise = gain; break; } }